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News

Students Wanted in NAIST Spring Seminer 2010

Upcoming Activities

Technical Committee on Dependable Computing (DC 2010)
Data: February 15, 2010
Place: Minato, Tokyo, Japan
     
  • Akira Taketani, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara,"Seed Selection for High Quality Delay Fault Test in BIST"
  • Makoto Nakao, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara,"Test Pattern Re-Ordering for Thermal-Uniformity during Test"
International conference on Design & Technology of Integrated Systems in nanoscale era (DTIS’10)
Date: March 23-25, 2010
Place: Hammamet, Tunisia
     
  • Satoshi Ohtake, Naotsugu Ikeda, Michiko Inoue and Hideo Fujiwara,"A Method of Unsensitizable Path Identification using High Level Design Information"
28th IEEE VLSI Test Symposium (VTS 2010)
Data: April 18-21, 2010
Place: Santa Cruz, California, USA
     
  • Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara,"Thermal-Uniformity-Aware X-Filling to Reduce Temperature-Induced Delay Variation for Accurate At-Speed Testing"

Awarded

Marie Engelene J. Obien(Doctor Course 2nd year) received IEEE ASICON 2009 Excellent Student Paper Award!(2009/10)